Nanometric patterns of DOPC (2nm thick) characterization: [SARFUS] as an alternative to [Fluorescence & AFM]

Author

M. HIRTZ

Publication Date

01/01/2010

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Date added: 2012-08-16 13:36:17 | Last time updated: 2012-08-16 11:36:17 | Viewed: 847 times

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